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Semiconductor device fabrication
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#	Item
321	1 Gate Counts The chart represents the number of people passing through the security gates at each library. Libraries not listed do not keep a gate count. Alderman1 Add to Reading List Source URL: assessment.library.virginia.edu Language: English - Date: 2014-07-28 12:22:32 Mon Architecture Gate count Semiconductor device fabrication Fiske Kimball
322	Technical Data Sheet • page 1 of 2 AMS, Inc. 105 Harrison Street American Falls, Idaho 83211 Add to Reading List Source URL: www.ams-samplers.com Language: English - Date: 2015-02-20 14:10:46 Matter Chemistry Nitrides Semiconductor device fabrication Titanium nitride
323	Photon Factory Activity Report 2009 #27 Part BSurface and Interface 2C/2008S2003 Annealing effects of in-depth profiles in TiN/LaO/HfSiO/SiO2/Si gate stack Add to Reading List Source URL: pfwww.kek.jp Language: English - Date: 2010-12-27 22:22:07 Materials science Semiconductor device fabrication Electronic engineering Superhard materials Condensed matter physics Photoemission spectroscopy Atomic layer deposition Titanium nitride Silicon dioxide Chemistry Emission spectroscopy Matter
324	Chemical Engineers and Semiconductors Add to Reading List Source URL: www.chemicalengineering.org Language: English - Date: 2010-08-02 15:56:43 Electronic engineering Integrated circuit Semiconductor device Applied Materials Doping Wafer Semiconductor Transistor Epitaxy Semiconductor device fabrication Technology Materials science
325	Measuring the absolute decay probability of implantation 82 Sr by ion Add to Reading List Source URL: www.phy.ornl.gov Language: English - Date: 2012-12-17 16:10:10 Radioactivity Nuclear physics Ions Charge carriers Ion implantation Ion source Electron Ion Beta decay Physics Chemistry Semiconductor device fabrication
326	Photon Factory Activity Report 2006 #24 Part BSurface and Interface 1C, 18A/2005G089 Change in conductivity through the space-charge layer of the Si substrate Add to Reading List Source URL: pfwww.kek.jp Language: English - Date: 2010-01-05 10:33:38 Semiconductor device fabrication Thin film deposition Epitaxy
327	Microsoft Word - 1_10_Mitsumasa_Koyanagi_ABSTRACT_BIO.docx Add to Reading List Source URL: inc11.org Language: English - Date: 2015-04-24 05:34:02 Integrated circuits Electronics Technology Electronic engineering Emerging technologies Computer memory Dynamic random-access memory Semiconductor device fabrication
328	Photon Factory Activity Report 2010 #28 Part BSurface and Interface 2C/2008S2-003 Effect of nitrogen bonding states on dipole at the HfSiO/SiON interface studied by Add to Reading List Source URL: pfwww.kek.jp Language: English - Date: 2012-01-30 04:32:45 Electronic engineering Semiconductor device fabrication Atomic physics Electromagnetism Photoemission spectroscopy High-k dielectric Titanium nitride Spectroscopy Core electron Physics Chemistry Emission spectroscopy
329	Microsoft PowerPoint - AC200 TDS v4.pptx Add to Reading List Source URL: www.swentnano.com Language: English - Date: 2014-11-07 19:16:41 Publishing Materials science Semiconductor device fabrication Coating Corrosion Nafion Substrate Carbon nanotube Layer Chemistry Printing Technology
330	APPLIED PHYSICS LETTERS 87, 091910 共2005兲 Interaction of nitrogen with vacancy defects in N+-implanted ZnO studied using a slow positron beam Z. Q. Chen,a兲 M. Maekawa, and A. Kawasuso Advanced Science Research Cen Add to Reading List Source URL: www.geocities.jp Language: English - Date: 2005-08-29 02:19:59 Ion implantation Materials science Annealing Chemical elements Zinc oxide Nitrogen Chemistry Semiconductor device fabrication Ceramic materials

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